Reflection electron microscopy observations of dislocations and dislocation motion in zinc oxide
Peng LM., Czernuszka JT.
Low index surfaces of zinc oxide have been examined using reflection electron microscopy (REM). Individual dislocations have been observed and identified using both the diffraction and phase contrast mechanisms. Sub-surface dislocations lying at least 2 μm beneath the surface have also been imaged. Most of the dislocations lie on the basal plane, but some were also observed on pyramidal planes. Under the action of the incident electron beam, abrupt dislocation motion was observed. This effect was greatest for observations on basal planes of sub-surface basal dislocations. © 1991 Taylor & Francis Group, LLC.